Refurbished Scanning & Transmission Electron Microscopes

JEOL JEM-2010 LaB6 emitter

jeol-jem-2010
For Sale a JEOL JEM-2010 LaB6 emitter; Transmission Electron Microscope. Refurbished, available for demonstration and evaluation. Sales price includes installation, system training, and 90 day conditional warranty period, both JEOL double-tilt specimen holder and standard specimen holder. Options include the following: a) An UTW EDS detector w/PC-based analyzer. b) AMT 4MB bottom-mount slow scan CCD camera system (PC-included). Original date of install March of 2001